IEEE Recommended Practice on Surge Voltages in Low-Voltage by IEEE Power Engineering Society. Surge Protective Devices

By IEEE Power Engineering Society. Surge Protective Devices Committee

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Additional info for IEEE Recommended Practice on Surge Voltages in Low-Voltage Ac Power Circuits. IEEE Power Engineering Society. Surge Protective Devices Committee

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5 n s Duration: 50 ns rf: 15 ns The rise time is defined a s t h e time difference between the 10% and 90% amplitude points on the leading edge of the waveform. The duration is defined as the full width a t half-maximum (FWHM), that is, the time difference between the 50% amplitude points on the leading and trailing edge of each individual pulse. Individual pulses occur in bursts with a duration of 15 ms f 3 ms. Within each burst, the repetition rate of pulses is specified a s a function of the peak open-circuit voltage: 10.

4 Fast Transients. , 1989 rB271). ” Under the name of “Electrical Fast Transients (EFT),” IEC 801-4 (1988) [51 requires a test involving bursts of surges with 5 ns rise time and 50 ns duration a t various severity levels. 1-1989 [SI), intended for protective relays and relay systems, also includes a fast transient specification. The waveform for the SWC test calls for a rise time of less than 1 0 n s and a duration of 150 ns, not very different from the 5 ns and 50 ns of the EFT. ) Furthermore, the SWC test is primarily intended for the high-voltage substation environment, while the EFT test is intended for general industrial equipment.

The majority of applications involve indoor envir o n m e n t s d o w n s t r e a m from a service entrance connection, remote from the stress levels involved in Location Category C. Thus, t h e description of t h e Location Category C environment should not be indiscriminately turned into a required performance specification for all equipment, just for the sake of conservative design. For a given exposure level, voltages are the same in Location Categories A a n d B; only t h e c u r r e n t levels change, decreasing from Location Category B t o Location Category A.

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